$39.95 USD • Used
Hardback in Near Fine condition without dust jacket. Volume 33. 9.0 X 6.1 X 0.7 inches. 236 pages. * Quick Shipping * All Books Mailed in Boxes * Free Tracking Provided *...
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Hardback in Near Fine condition without dust jacket. Volume 33. 9.0 X 6.1 X 0.7 inches. 236 pages. * Quick Shipping * All Books Mailed in Boxes * Free Tracking Provided *
From Publisher:
In Waveguide Spectroscopy of Thin Films new methods of study of the linear and nonlinear optical properties of thin films are presented. These techniques are based on the principles of the spatial Fourier spectroscopy of the light beam reflected from a prism-coupling device with the tunnel excitation of guided lightmodes in thin-film structures.
Measurement techniques of determination of the absorption coefficient, refractive index and thickness of the dielectric, semiconductor or metallic films are considered.
This book is highly recommended for specialists in the fields of integrated and thin film optics and for graduated students in related specialties.
Product Info
ISBN: 0120885158
ISBN-13: 9780120885152
Publisher: Academic Press
Year: 2006
Type: Used
Binding: Hardcover
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EastonsBooksInc
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Country: United States